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Integrated Test System for Passive Components Characterization

Exfo Inc. has released one of the fastest test systems for insertion loss (IL) and return loss (RL) measurement for a wide variety of passive components, including photonics integrated circuits (PICs). Integrating cutting-edge technology from the recently acquired Yenista Optics, Exfo’s CTP10 can be used by research scientists to extensively characterize components or in automated mode for high volume production.

With the increasing demand for PICs composed of hundreds of passive components, and the constant pressure to reduce network equipment costs, passive component manufacturers are looking for effective testing solutions to reduce their testing time without sacrificing accuracy and reliability. With a capability to measure IL and RL in a single sweep up to 1000 nm/s, this is what the new CTP10 component test platform offers them.

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